The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Oct. 10, 2017
Applicant:

Endress+hauser Process Solutions Ag, Reinach, CH;

Inventors:

Michael Mayer, Oberwil, CH;

Jan Pflug, Basel, CH;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0272 (2013.01); G05B 23/0264 (2013.01); Y02P 90/02 (2015.11);
Abstract

The invention comprises a method for analyzing malfunctions and/or changes of device statuses in a system of automation technology, wherein the system has a plurality of field devices communicating with one another directly via a communication network and being designed to issue an appropriate diagnostic notice depending on a malfunction or a change of a device status in the system. The diagnostic notices are transmitted to a data bank and stored in same. The method comprises: reading the diagnostic notices from the data bank; filtering the read diagnostic notices using at least one selection criterion; linking the filtered diagnostic notices using time stamps; defining time intervals; grouping the diagnostic notices linked using the time stamps into the defined time intervals which correspond to their respective time stamps; and evaluating the grouped diagnostic notices with regard to defined abnormalities.


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