The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Sep. 24, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Kazuhiro Satou, Yamanashi, JP;

Kazunori Iijima, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G05B 23/02 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 19/4183 (2013.01); G05B 23/024 (2013.01); G06N 20/00 (2019.01); G05B 23/0237 (2013.01); G05B 2219/31211 (2013.01); G05B 2219/31264 (2013.01); G05B 2219/31484 (2013.01);
Abstract

A diagnostic apparatus of the invention acquires normal data related to an operating state during normal operation of an industrial machine, stores the normal data, generates a learning model by learning based on the stored normal data, and performs an estimation process for normality or abnormality of an operation of the industrial machine using the learning model. The diagnostic apparatus of the invention further generates verification data including at least one piece of abnormal data based on the stored normal data to verify validity of the learning model on receiving a result of the estimation process using the learning model based on the verification data.


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