The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Mar. 31, 2017
Applicant:

Eos Gmbh Electro Optical Systems, Krailling, DE;

Inventors:

Hannu Heikkinen, Kaarina, FI;

Tatu Syvänen, Preitilä, FI;

Michael Göth, Munich, DE;

Ludger Hümmeler, Gauting, DE;

Thomas Hoferer, Gauting, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 50/02 (2015.01); B22F 10/20 (2021.01); B33Y 10/00 (2015.01); B22F 10/30 (2021.01); G05B 19/4093 (2006.01);
U.S. Cl.
CPC ...
G05B 19/40937 (2013.01); B22F 10/20 (2021.01); B33Y 50/02 (2014.12); B22F 10/30 (2021.01); B33Y 10/00 (2014.12); G05B 2219/49007 (2013.01); G05B 2219/49013 (2013.01); G05B 2219/49018 (2013.01);
Abstract

A method for providing control data for manufacturing at least one three-dimensional object by means of a layer-wise solidification of a building material in an additive manufacturing apparatus is provided. The method includes at least the following steps: a) determining the locations corresponding to the cross section of the at least one object, b) determining at least two different regions to be solidified in said at least one layer, wherein said at least two regions are chosen from the group of: sandwiched region, down-facing region and up-facing region, c) defining a scanning sequence for the beam so as to solidify the building material at least at the locations corresponding to said portion of the cross section of the object, wherein at an interface between a first and a second region differing from each other a scan line of the beam is continuous and at least one beam parameter value is changed.


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