The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Nov. 13, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Hiroki Sawaoka, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/404 (2006.01); B23Q 15/12 (2006.01);
U.S. Cl.
CPC ...
G05B 19/404 (2013.01); B23Q 15/12 (2013.01); G05B 2219/37087 (2013.01);
Abstract

A numerical control device causes a machine tool to perform cutting with a command coordinate value indicated by a cutting command received from a command analysis unit. The numerical control device includes a dynamic compensation parameter calculation unit that calculates a dynamic compensation parameter for compensating for a dynamic error generated by a force acting on the machine tool and a velocity upon cutting, based on a command shape, and a dynamic compensation unit that compensates for the dynamic error with respect to the command coordinate value, based on the dynamic compensation parameter calculated, in which the dynamic compensation parameter calculation unit acquires only the dynamic error from a comparison of the command shape and the measurement data, and calculates the dynamic compensation parameter from the dynamic error acquired.


Find Patent Forward Citations

Sawaoka, Hiroki. (2023). Numerical control device and control method (U.S. Patent No. 11550290). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11550290

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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