The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2023
Filed:
Jan. 26, 2021
Carl Zeiss Meditec Ag, Jena, DE;
Alois Regensburger, Poxdorf, DE;
Christoph Nieten, Jena, DE;
Artur Hoegele, Oberkochen, DE;
Christoph Hauger, Aalen, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A microscopy method is for producing an electronic image of an object, wherein the object is imaged with an adjustable optical imaging scale on an image detector. The method includes: selecting a parameter for the electronic image, wherein the parameter can be influenced by the optical imaging scale and differs from the image field dimensions, and setting a setpoint value range for the parameter, setting a total imaging scale for the electronic image, wherein adjusting or controlling the parameter of the electronic image is implemented such that, at the same time, the parameter of the electronic image lies in the specified setpoint value range with a tolerance and the set total imaging scale is obtained, wherein the optical imaging scale forms a basis for a manipulated variable of the adjustment or closed-loop control and a digital image magnification is carried out on the basis of the set total imaging scale.