The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Feb. 23, 2021
Applicant:

Tecat Technologies (Suzhou) Limited, Suzhou, CN;

Inventor:

Choon Leong Lou, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/44 (2006.01); G01R 31/28 (2006.01); G01K 7/22 (2006.01);
U.S. Cl.
CPC ...
G01R 1/44 (2013.01); G01K 7/22 (2013.01); G01R 1/06716 (2013.01); G01R 31/2831 (2013.01);
Abstract

A probing system includes a chuck configured to support a device under test (DUT); and a manipulator disposed above the chuck and including a first probe protruding from the manipulator toward the chuck, wherein the first probe includes a temperature-sensing device for sensing a temperature adjacent to a front surface of the DUT. A probing device includes a chuck; a DUT disposed over the chuck; a manipulator disposed above the DUT, wherein the manipulator includes a first probe protruding from the manipulator toward the DUT and including a temperature-sensing device for sensing a temperature, the DUT is moved toward the manipulator for sensing a temperature of the DUT by the first probe.


Find Patent Forward Citations

Lou, Choon. (2023). Probing system (U.S. Patent No. 11549968). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11549968

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…