The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Jul. 25, 2016
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Shunsuke Sasaki, Tokyo, JP;

Kenta Imai, Tokyo, JP;

Toshiharu Suzuki, Tokyo, JP;

Katsuhiko Sakamoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); B01L 9/00 (2006.01); G01N 27/327 (2006.01); G01N 33/53 (2006.01); G01N 35/10 (2006.01); G01N 35/04 (2006.01); G01J 1/32 (2006.01); G01N 21/76 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00584 (2013.01); G01N 35/00 (2013.01); B01L 3/00 (2013.01); B01L 9/00 (2013.01); G01J 1/32 (2013.01); G01N 21/76 (2013.01); G01N 27/327 (2013.01); G01N 33/53 (2013.01); G01N 35/04 (2013.01); G01N 35/10 (2013.01); G01N 2035/00346 (2013.01);
Abstract

An automated analyzer includes an analysis operation part that causes a sample and a reagent to react and based on the reaction result performs analysis of the sample, wherein: the automated analyzer includes a plurality of units constituting the analysis operation part, a temperature adjustment mechanism that heats or cools the units, a temperature sensor that measures the temperature of the units, and a control part that controls the temperature adjustment mechanism. The control part sets the measurement startable temperature range of each unit, which is the temperature range of the operation specification thereof, and the operable temperature range, which is a temperature range that is wider than the measurement startable temperature range, and starts the analysis process of the sample when the temperature of each unit has entered the operable temperature range.


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