The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2023
Filed:
Sep. 27, 2018
Applicants:
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Inventors:
Wen-Yun Wu, Beijing, CN;
Jing-Ying Yue, Beijing, CN;
Xiao-Yang Lin, Beijing, CN;
Qing-Yu Zhao, Beijing, CN;
Kai-Li Jiang, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Assignees:
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01); G01N 21/64 (2006.01); G02B 21/33 (2006.01); B82B 3/00 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); B82B 3/009 (2013.01); G01N 21/6458 (2013.01); G02B 21/33 (2013.01); G01N 2021/4792 (2013.01); H01J 2201/30469 (2013.01);
Abstract
A device for imaging one dimension nanomaterials is provided. The device includes an optical microscope with a liquid immersion objective, a laser device, and a spectrometer. The laser device is configured to provide an incident light beam with a continuous spectrum. The spectrometer is configured to obtain spectral information of the one dimensional nanomaterials.