The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2023
Filed:
Aug. 09, 2019
Corning Incorporated, Corning, NY (US);
Benedict Osobomen Egboiyi, Painted Post, NY (US);
James Edward Morrison, Jr., Campbell, NY (US);
Patrick Ryan Pruden, Corning, NY (US);
Ananthanarayanan Subramanian, Corning, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
A test apparatus comprises a probe movably mounted relative to a carrier. The probe comprises an end portion with a surface area of about 5 mmor less. The test apparatus can be used in methods of determining a crush strength of an edge of a substrate. Methods can comprise aligning the probe with a test location of the substrate at a predetermined angle relative to a probe axis. Methods can further comprise applying a mechanical force to the test location with the probe in the direction of the probe axis. Also, methods can comprise increasing the mechanical force applied by the probe until the substrate cracks or a predefined force applied by the probe is reached. Based on the mechanical force applied by the probe, a crush strength of an edge can be determined.