The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

May. 18, 2018
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Hirokazu Tatsuta, Kanagawa, JP;

Takeshi Kunihiro, Kanagawa, JP;

Kazuhiro Nakagawa, Saiatama, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 3/00 (2006.01); C12M 1/00 (2006.01); C12M 1/34 (2006.01); G01N 15/14 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
C12M 41/06 (2013.01); C12M 31/00 (2013.01); C12M 31/08 (2013.01); C12M 41/36 (2013.01); G01N 15/1436 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1452 (2013.01); G01N 2015/1486 (2013.01);
Abstract

A measurement apparatus according to an embodiment of the present technology includes a light source, a filling portion, and a detector. The light source emits illumination light. The filling portion includes a first surface portion and a second surface portion which are provided on an optical path of the illumination light and are opposite to each other, the filling portion enabling a cavity between the first and second surface portions to be filled with liquid including a cell. The detector detects an interference fringe of the illumination light passing through the cavity, the interference fringe being caused by the liquid including the cell.


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