The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

May. 07, 2020
Applicant:

Concept Laser Gmbh, Lichtenfels, DE;

Inventors:

Martin Wachter, Lichtenfels, DE;

Tim Klaussner, Kronach, DE;

Assignee:

CONCEPT LASER GMBH, Lichtenfels, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/60 (2006.01); B29C 64/393 (2017.01); B33Y 50/02 (2015.01); G05B 19/042 (2006.01); G06T 7/00 (2017.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B33Y 50/02 (2014.12); G05B 19/042 (2013.01); G06T 7/00 (2013.01); G06T 7/80 (2017.01); G05B 2219/49023 (2013.01);
Abstract

Method for determining an operational parameter for an imaging device for imaging at least one part of a build plane, in particular for a determination device for determining at least one parameter of an energy beam for an apparatus for additively manufacturing three-dimensional objects, comprising the steps: determining at least one spot parameter that relates to an extension of a spot, in particular a spot of an energy beam, in a determination plane; determining a difference between the determined spot parameter and a nominal spot parameter; determining an imaging parameter of the imaging device based on the determined difference adjusting the imaging parameter based on the determined difference.


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