The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2023
Filed:
Feb. 14, 2020
Applicant:
United Technologies Corporation, Farmington, CT (US);
Inventors:
Anton I. Lavrentyev, Cromwell, CT (US);
Alexander Staroselsky, Avon, CT (US);
Sergey Mironets, Charlotee, NC (US);
Assignee:
Raytheon Technologies Corporation, Farmington, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/20 (2021.01); B33Y 10/00 (2015.01); B23K 26/342 (2014.01); B33Y 50/02 (2015.01); G01N 29/26 (2006.01); B29C 64/386 (2017.01); B33Y 30/00 (2015.01); B33Y 40/00 (2020.01); B23K 26/70 (2014.01); B23K 15/00 (2006.01); B23K 26/08 (2014.01); B22F 10/30 (2021.01);
U.S. Cl.
CPC ...
B22F 10/20 (2021.01); B23K 15/0026 (2013.01); B23K 15/0086 (2013.01); B23K 26/083 (2013.01); B23K 26/342 (2015.10); B23K 26/702 (2015.10); B29C 64/386 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12); G01N 29/262 (2013.01); B22F 10/30 (2021.01); B22F 2999/00 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/106 (2013.01); Y02P 10/25 (2015.11);
Abstract
An additive manufacturing system includes an ultrasonic inspection system integrated in such a way as to minimize time needed for an inspection process. The inspection system may have an ultrasonic phased array integrated into a build table for detecting defects in each successive slice of a workpiece and such that each slice may be re-melted if and when defects are detected.