The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2023

Filed:

Feb. 05, 2020
Applicant:

Ascensia Diabetes Care Holdings Ag, Basel, CH;

Inventor:

Huan-Ping Wu, Granger, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/145 (2006.01); A61B 5/00 (2006.01); A61B 5/1486 (2006.01); A61B 5/01 (2006.01); A61B 5/1495 (2006.01); A61M 5/172 (2006.01);
U.S. Cl.
CPC ...
A61B 5/14532 (2013.01); A61B 5/002 (2013.01); A61B 5/01 (2013.01); A61B 5/1486 (2013.01); A61B 5/1495 (2013.01); A61B 2560/0223 (2013.01); A61B 2560/0238 (2013.01); A61M 2005/1726 (2013.01);
Abstract

Apparatus and methods are operative to probe the condition of a sensor either initially, at any point thereafter or continuously during a continuous sensor operation for measuring an analyte in a bodily fluid (such as performed by, e.g., a continuous glucose monitoring (CGM) sensor). Results of the probe may include calibration indices determined from electrical signals obtained during the probe. The calibration indices may indicate whether in-situ adjustment of the sensor's calibration should be performed either initially and/or at random check points. Probing potential modulation parameters also may be used during analyte calculations to reduce the effects of lot-to-lot sensitivity variations, sensitivity drift during monitoring, temperature, interferents, and/or the like. Other aspects are disclosed.


Find Patent Forward Citations

Loading…