The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Jul. 10, 2020
Applicants:

Yutaka Ohmiya, Tokyo, JP;

Hideki Hashimoto, Tokyo, JP;

Masamoto Nakazawa, Kanagawa, JP;

Inventors:

Yutaka Ohmiya, Tokyo, JP;

Hideki Hashimoto, Tokyo, JP;

Masamoto Nakazawa, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/3745 (2011.01); H04N 5/365 (2011.01); H04N 5/367 (2011.01); H04N 1/407 (2006.01); H04N 1/60 (2006.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
H04N 5/367 (2013.01); H04N 1/6027 (2013.01); H04N 5/378 (2013.01); H04N 5/37455 (2013.01);
Abstract

An abnormal-pixel detecting device includes an image sensor and an image processor. The image sensor is configured to capture an image of a subject. The image processor is configured to calculate: a ratio between a first plurality of pixel values captured by the image sensor and a second plurality of pixel values whose reference position is shifted relative to the first plurality of pixel values in a main scanning direction to obtain a third plurality of pixel values; and detect an abnormal pixel in the third plurality of pixel values.


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