The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Aug. 31, 2020
Fujifilm Corporation, Tokyo, JP;
Shuji Ono, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are an imaging apparatus, an imaging method, an imaging program, and an imaging system capable of easily making an imaging plan. The imaging apparatus () includes an imaging evaluation map acquiring section () that acquires an imaging evaluation map, and an imaging point selecting section () that selects an imaging point suitable for imaging an object and an imaging condition at the imaging point on the basis of the acquired imaging evaluation map. In the imaging evaluation map, an evaluation value that represents an evaluation of imaging in a case where an object is imaged at a specific position under a specific imaging condition is set at a plurality of imaging candidate positions for each of a plurality of imaging conditions.