The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Mar. 26, 2020
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventors:

Anthony L. Lentine, Albuquerque, NM (US);

Grant Biedermann, Albuquerque, NM (US);

Michael Gehl, Albuquerque, NM (US);

Christopher DeRose, Victor, NY (US);

Jongmin Lee, Albuquerque, NM (US);

Kevin Michael Fortier, Milwaukie, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/50 (2006.01); G02B 27/10 (2006.01); G02F 1/37 (2006.01); H01S 5/04 (2006.01); H01S 5/0683 (2006.01); H01S 5/34 (2006.01); G02F 1/355 (2006.01); H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
H01S 5/5045 (2013.01); G02B 27/106 (2013.01); G02F 1/3551 (2013.01); G02F 1/37 (2013.01); H01S 3/0078 (2013.01); H01S 3/0085 (2013.01); H01S 3/0092 (2013.01); H01S 5/041 (2013.01); H01S 5/0683 (2013.01); H01S 5/34 (2013.01); G02F 2203/48 (2013.01);
Abstract

A compact laser source and a single sideband modulator used therein is disclosed. The compact laser source includes a seed laser and one or more channels, with each channel generating one or more output laser beams having corresponding different wavelengths. The compact laser source can be formed in whole or in part on a single optical motherboard to thereby minimize space and power requirements. By employing the disclosed single sideband modulator, harmonics in the generated output laser beams can be minimized. The compact laser source finds application in an atom interferometer (AI) system, which may be used to measure gravity, acceleration, or rotation of the AI system.


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