The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Jun. 28, 2021
Applicants:

Shimadzu Corporation, Kyoto, JP;

Hiroshima University, Higashihiroshima, JP;

Inventors:

Koichi Tanaka, Kyoto, JP;

Takushi Yamamoto, Kyoto, JP;

Manaho Yamaguchi, Higashihiroshima, JP;

Shunsuke Izumi, Higashihiroshima, JP;

Assignees:

SHIMADZU CORPORATION, Kyoto, JP;

HIROSHIMA UNIVERSITY, Higashihiroshima, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/16 (2006.01); G01N 33/487 (2006.01); G01N 27/626 (2021.01); H01J 49/00 (2006.01); G01N 33/00 (2006.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
H01J 49/164 (2013.01); G01N 27/628 (2013.01); G01N 33/0047 (2013.01); G01N 33/487 (2013.01); G01N 33/68 (2013.01); H01J 49/0004 (2013.01);
Abstract

One mode is a method for the structural analysis of an organic compound by MALDI mass spectrometry, including: a sample preparation process (S) which includes preparing a sample by mixing a specimen containing an organic compound to be analyzed with a predetermined matrix at a mixture ratio within a range from 1:5 to 1:5000 in molar ratio; a mass spectrometry process (S) which includes irradiating the prepared sample with a laser beam having a spot size equal to or smaller than 15 μm to generate ions originating from a component of the specimen in the sample, and performing a mass spectrometric analysis of the generated ions; and an analyzing process (S) which includes detecting, from a mass spectrum acquired in the mass spectrometry process, ions including product ions resulting from in-source decay, and estimating the structure of the organic compound to be analyzed based on information concerning the ions.


Find Patent Forward Citations

Loading…