The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Oct. 30, 2020
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Devin Bhushan, San Jose, CA (US);

Seunghee Han, San Jose, CA (US);

Caelin Thomas Jackson-King, Gormley, CA;

Jamie Kuppel, Sunnyvale, CA (US);

Stanislav Yazhenskikh, Santa Clara, CA (US);

Jim Jiaming Zhu, Scarborough, CA;

Assignee:

SPLUNK INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G06F 3/14 (2006.01);
U.S. Cl.
CPC ...
G06T 17/205 (2013.01); G06F 3/1454 (2013.01);
Abstract

Various implementations or examples set forth a method for scanning a three-dimensional (3D) environment. The method includes generating a 3D representation of the 3D environment that includes one or more 3D meshes. The method also includes determining at least a portion of the 3D environment that falls within a current frame captured by the image sensor. The method further includes generating one or more additional 3D meshes representing the at least a portion of the 3D environment and combining the one or more additional 3D meshes with the one or more 3D meshes into an update to the 3D representation of the 3D environment.


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