The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Dec. 31, 2018
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Raja Bala, Pittsford, NY (US);
Vijay Kumar Baikampady Gopalkrishna, San Jose, CA (US);
Chaman Singh Verma, Mountain View, CA (US);
Scott K. Stanley, Mason, OH (US);
Andrew P. Rapach, Liberty Township, OH (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
A system is provided for generating a custom article to fit a target surface. During operation, the system compares an input dataset with a number of cut template cut meshes. A respective cut template cut mesh includes one or more cutting paths that correspond to a boundary of the mesh. Next, the system identifies a template cut mesh that produces a closest match with the input dataset, and applies global geometric transformations to the identified template cut mesh to warp the template cut mesh to conform to the input dataset. The system further refines and projects a set of boundary and landmark points from the template cut mesh to the input dataset to define cutting paths for the input dataset. Next, the system applies cutting paths to the input dataset to produce a cut-and-trimmed mesh.