The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Sep. 10, 2020
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Bo Zong, West Windsor, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Lichen Wang, Malden, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01); G06V 10/75 (2022.01); G06K 9/62 (2022.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06F 21/56 (2013.01); G06K 9/6215 (2013.01); G06K 9/6288 (2013.01); G06K 9/6296 (2013.01); G06N 3/049 (2013.01); G06V 10/751 (2022.01);
Abstract

Methods and systems for detecting abnormal application behavior include determining a vector representation of a first syscall graph that is generated by a first application, the vector representation including a representation of a distribution of subgraphs of the first syscall graph. The vector representation of the first syscall graph is compared to one or more second syscall graphs that are generated by respective second applications to determine respective similarity scores. It is determined that the first application is behaving abnormally based on the similarity scores, and a security action is performed responsive to the determination that the first application is behaving abnormally.


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