The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Nov. 20, 2020
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Subrata Mitra, Karnataka, IN;

Nikhil Sheoran, Chandigarh, IN;

Anup Rao, San Jose, CA (US);

Tung Mai, San Jose, CA (US);

Sapthotharan Krishnan Nair, Santa Clara, CA (US);

Shivakumar Vaithyanathan, San Jose, CA (US);

Thomas Jacobs, Cupertino, CA (US);

Ghetia Siddharth, Gujarat, IN;

Jatin Varshney, Uttar Pradesh, IN;

Vikas Maddukuri, Andhra Pradesh, IN;

Laxmikant Mishra, Maharashtra, IN;

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2458 (2019.01); G06F 16/215 (2019.01); G06F 16/28 (2019.01); G06F 16/22 (2019.01); G06N 20/00 (2019.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06F 16/2462 (2019.01); G06F 16/215 (2019.01); G06F 16/2237 (2019.01); G06F 16/285 (2019.01); G06K 9/6256 (2013.01); G06K 9/6277 (2013.01); G06N 20/00 (2019.01);
Abstract

In some embodiments, a model training system trains a sample generation model configured to generate synthetic data entries for a dataset. The sample generation model includes a prior model for generating an estimated latent vector from a partially observed data entry, a proposal model for generating a latent vector from a data entry of the dataset and a mask corresponding to the partially observed data entry, and a generative model for generating the synthetic data entries from the latent vector and the partially observed data entry. The model training system trains the sample generation model to optimize an objective function that includes a first term determined using the synthetic data entries and a second term determined using the estimated latent vector and the latent vector. The trained sample generation model can be executed on a client computing device to service queries using the generated synthetic data entries.


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