The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Jan. 28, 2021
Applicant:

Opshub Inc., Palo Alto, IN;

Inventors:

Sandeep Jain, Palo Alto, CA (US);

Vibhuti Bhushan, Bellevue, WA (US);

Aparna Garg, Gurgaon, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/40 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 8/40 (2013.01);
Abstract

A system including an impact analysis engine (IAE) and a method for analyzing impact of changes to a software code are provided. The IAE iteratively processes and compares lines of the software code changed across different versions of the software code for deriving the impact of changes performed for a requested version. The IAE automatically identifies artifacts impacted by changes to each line of the software code across different versions by processing code change data. The code change data includes change data between start and end tags of the software code and commit actions previous to the start tag. The code change data includes unique identifiers of artifacts traced to the commit actions, which allow customized retrieval of artifact data including features, defects, and epics impacted by changes to each line of the software code. The IAE automatically identifies linked elements, for example, tests, traced to the identified artifacts.


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