The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Jan. 27, 2021
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Feng Xie, Munich, DE;

Taro Eichler, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/17 (2015.01); G01R 31/28 (2006.01); G01R 31/00 (2006.01); G06N 20/00 (2019.01); G06F 11/22 (2006.01); G06F 1/28 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2257 (2013.01); G06F 1/28 (2013.01); G06N 20/00 (2019.01); H04B 17/17 (2015.01);
Abstract

A signal analysis method of analyzing a performance of a device under test is described. A digitized input signal is obtained, wherein the digitized input signal is associated with the device under test. At least one characteristic quantity is determined via an artificial intelligence circuit. The artificial intelligence circuit includes at least one computing parameter. The at least one characteristic quantity is determined based on the digitized input signal and based on the at least one computing parameter. The at least one characteristic quantity is indicative of at least one performance property of the device under test. Further, a test system for analyzing a performance of a device under test as well as a computer program or program product are described.


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