The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

May. 27, 2021
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Kanika Kapish, Muzaffarnagar, IN;

Hung Dinh, Austin, TX (US);

Bijan Kumar Mohanty, Austin, TX (US);

Rômulo Teixeira de Abreu Pinho, Niterói, BR;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0709 (2013.01); G06F 11/079 (2013.01); G06F 11/0778 (2013.01);
Abstract

A method comprises collecting operational data for one or more devices and identifying one or more anomalies associated with the one or more devices based at least in part on the collected operational data. At least a portion of the collected operational data corresponding to the identified one or more anomalies is analyzed, and a probability of automatic resolution for respective ones of the identified one or more anomalies is determined based at least in part on the analysis. The identifying, the analyzing and the determining are performed using one or more machine learning models.


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