The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Aug. 11, 2020
Hitachi, Ltd., Tokyo, JP;
Hamed Khorasgani, San Jose, CA (US);
Ahmed Khairy Farahat, Santa Clara, CA (US);
Chetan Gupta, San Mateo, CA (US);
Wei Huang, San Jose, CA (US);
Hitachi, Ltd., Tokyo, JP;
Abstract
Example implementations described herein involve a new data-driven analytical redundancy relationship (ARR) generation for fault detection and isolation. The proposed solution uses historical data during normal operation to extract the data-driven ARRs among sensor measurements, and then uses them for fault detection and isolation. The proposed solution thereby does not need to rely on the system model, can detect and isolate more faults than traditional data-driven methods, can work when the system is not fully observable, and does not rely on a vast amount of historical fault data, which can save on memory storage or database storage. The proposed solution can thereby be practical in many real cases where there are data limitations.