The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Jul. 22, 2020
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Reiko Kondo, Yamato, JP;

Takeshi Yasuie, Kawasaki, JP;

Masahiro Asaoka, Kawasaki, JP;

Kazuhiro Suzuki, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 11/008 (2013.01); G06F 9/45558 (2013.01); G06F 11/004 (2013.01); G06F 2009/45591 (2013.01); G06F 2009/45595 (2013.01);
Abstract

A method includes: acquiring, based on status information, a failure risk of each of a plurality of devices including physical devices and virtual machines, each of the virtual machines being operated on any of the physical devices, the status information indicating the statuses of the plurality of devices; acquiring an influence range based on route information indicating a link in a range affected by a failure; acquiring a first influence risk based on a failure risk acquired for a first device, the first physical device being any of the physical devices; acquiring a second influence risk based on a failure risk of a second device, the second influence risk indicating a possibility of a target device being affected by a failure in another device; and determining the second physical devices as a destination candidate of the target device when the second influence risk is lower than the first influence risk.


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