The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Dec. 29, 2020
Applicants:

Atlassian Pty Ltd., Sydney, AU;

Atlassian Inc., San Francisco, CA (US);

Inventors:

Gaurav Awadhwal, Sydney, AU;

Addo Wondo, Sydney, AU;

Geoff Sims, Sydney, AU;

Gyeun Gyun Rho, Auckland, NZ;

Ahmed Saad, Sydney, AU;

Simon Hugo Robilliard, Sydney, AU;

Assignees:

ATLASSIAN PTY LTD., Sydney, AU;

ATLASSIAN US, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/54 (2006.01); G06N 20/00 (2019.01); G06Q 30/00 (2012.01);
U.S. Cl.
CPC ...
G06F 9/542 (2013.01); G06N 20/00 (2019.01); G06Q 30/016 (2013.01);
Abstract

Systems, methods and non-transitory computer readable media for detecting incidents are disclosed. The method includes receiving a primary issue creation event record for a primary issue, the event record including a description of the primary issue, and encoding the primary issue into a primary vector number based on the description of the primary issue. The method further includes identifying candidate issues and retrieving vector numbers of the identified candidate issues, computing distances between the primary vector number and each of the candidate vector numbers, and determining whether incident criteria is met based on the computed distances. In addition, the method includes determining that an incident has occurred upon determining that the incident criteria is met and generating an alert.


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