The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Apr. 06, 2021
Nec Laboratories America, Inc., Princeton, NJ (US);
Dongjin Song, Princeton, NJ (US);
Takehiko Mizoguchi, West Windsor, NJ (US);
Cristian Lumezanu, Princeton Junction, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Abstract
Methods and systems for detecting and correcting anomalies includes generating historical binary codes from historical time series segments. The historical time series segments are each made up of measurements from respective sensors. A latest binary code is generated from a latest time series segment. It is determined that the latest time series segment represents anomalous behavior, based on a comparison of the latest binary code to the historical binary codes. The sensors are ranked, based on a comparison of time series data of the sensors in the latest time series segment to respective time series data of the historical time series, to generate a sensor ranking. A corrective action is performed responsive to the detected anomaly, prioritized according to the sensor ranking.