The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Nov. 01, 2021
Alexander Tarasov, Houston, TX (US);
Jinsong Zhao, Houston, TX (US);
Alexander Tarasov, Houston, TX (US);
Jinsong Zhao, Houston, TX (US);
Other;
Abstract
A device and method for nondestructively inspecting, measuring, and/or detecting metallic. The device may enable multiple synthetic apertures for measurements simultaneously. The device includes a transmitter coil array and a receiver coil array wound around a core. The receiver coil array includes multiple receiver coil sections built with gaps in between adjacent sections to form multiple associated apertures. An analog electrical network is coupled to the multiple receiver coil sections to enable multiple combined synthetic apertures to be operated together for the transducer to conduct measurements simultaneously to provide multiple outputs associated to the multiple synthetic apertures. Measurement signals can be combined to build a processed signal that can represent more accurate information from the target.