The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Mar. 18, 2021
Applicant:

Anpec Electronics Corporation, Hsinchu, TW;

Inventors:

Chuang-Shun Xu, Hsinchu, TW;

Ming-Hung Chang, Hsinchu, TW;

Wen-Yen Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G01R 31/26 (2020.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3191 (2013.01); G01R 31/31905 (2013.01); G01R 31/31924 (2013.01); G01R 31/2635 (2013.01); G09G 3/006 (2013.01);
Abstract

A circuit measuring device and a method thereof are provided. A voltage source supplies a common voltage such that a calibration current having a preset current value flows from a current-voltage converter to a final test machine. The current-voltage converter converts the calibration current into a calibration voltage. At this time, a voltage sensing component senses a voltage between an input terminal and an output terminal of the current-voltage converter to output sensed calibration data. The current-voltage converter converts a tested current outputted by a tested circuit into a tested voltage. At this time, the voltage sensing component senses the voltage between the input terminal and the output terminal of the current-voltage converter to output actual sensed data. When the final test machine determines that a difference between the sensed calibration data and the actual sensed data is larger than a threshold, the tested circuit is adjusted.


Find Patent Forward Citations

Xu, Chuang-Shun. (2023). Circuit measuring device and method (U.S. Patent No. 11543455). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11543455

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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