The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Jun. 23, 2021
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Wonseok Lee, Suwon-si, KR;

Ji-Hoon Suh, Daejeon, KR;

Minkyu Je, Daejeon, KR;

Sang Joon Kim, Hwaseong-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/16 (2006.01); G01N 27/02 (2006.01); H03M 1/00 (2006.01); A61B 5/053 (2021.01);
U.S. Cl.
CPC ...
G01R 27/16 (2013.01); G01N 27/028 (2013.01); H03M 1/001 (2013.01); A61B 5/053 (2013.01);
Abstract

An impedance measuring apparatus is disclosed. The impedance measuring apparatus includes an input current generator configured to generate a sinusoidal input signal of a carrier frequency, a first electrode configured to apply the sinusoidal input signal to an object which has an impedance, a second electrode configured to receive an amplitude modulated signal from the object, a first amplifier configured to amplify the received amplitude modulated signal and output a first amplified signal, a baseline signal subtractor configured to subtract a baseline signal generated based on the first amplified signal from the amplitude modulated signal and output a subtraction modulated signal, an analog-to-digital converter (ADC) configured to convert the subtraction modulated signal to a digital modulated signal, and an impedance measurer configured to measure the impedance based on the digital modulated signal.


Find Patent Forward Citations

Quick Actions:

Lee, Wonseok. (2023). Impedance measuring apparatus (U.S. Patent No. 11543443). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11543443

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…