The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Aug. 25, 2016
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Kiyohiro Sugiyama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 35/0092 (2013.01); G01N 2035/0096 (2013.01); G01N 2035/00831 (2013.01); G01N 2035/00851 (2013.01);
Abstract

The automatic analysis system comprises an analysis device which introduces sample containers which have been placed at a predetermined placement location into an analysis unit to perform analysis on the samples, and a management device which has a function of transmitting identification information for a sample to said analysis device when an analysis request has been made for that sample. The analysis device comprises a sample information management unit which retains sample identification information transmitted from the management device as analysis-requested sample information and retains identification information for samples which have been analyzed by the analysis unit as analysis-completed sample information.


Find Patent Forward Citations

Sugiyama, Kiyohiro. (2023). Automatic analysis system (U.S. Patent No. 11543422). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11543422

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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