The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Nov. 26, 2018
Hitachi High-tech Corporation, Tokyo, JP;
Shunsuke Baba, Tokyo, JP;
Kuniaki Onizawa, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
A specimen processing systemwhich performs preprocessing and analysis of a specimen includes sensors, . . . each detecting a driving state of a driving device installed in the system, an abnormality detecting partdetermining from signal waveforms detected by the sensors, . . . whether an abnormality occurs in the driving device, and a recording device sequentially recording the signal waveforms detected by the sensors, . . . and storing a sensor signal waveform before or after the occurrence of an operation abnormality into an unerasable area when the abnormality is determined to have occurred in the abnormality detection part. Consequently, there is provided a specimen processing system capable of realizing restoration from the time of the occurrence of an abnormality faster than in the past.