The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

May. 04, 2018
Applicant:

Analog Devices, Inc., Norwood, MA (US);

Inventors:

Thomas G. O'Dwyer, Arlington, MA (US);

Gaurav Vohra, Sudbury, MA (US);

Xin Zhang, Acton, MA (US);

YounJae Kook, Winchester, MA (US);

Isaac Chase Novet, Carlsbad, CA (US);

Venugopal Gopinathan, Boston, MA (US);

Assignee:

Analog Devices, Inc., Norwood, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/09 (2006.01); G01N 33/487 (2006.01); G01N 27/02 (2006.01); G01N 33/49 (2006.01); G01N 33/493 (2006.01); G01N 27/12 (2006.01); G01N 27/22 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48707 (2013.01); G01N 27/028 (2013.01); G01N 33/49 (2013.01); G01N 33/493 (2013.01); G01N 27/12 (2013.01); G01N 27/227 (2013.01);
Abstract

An impedance measurement system for detecting an analyte in a sample is disclosed. The system includes first, second, and third electrodes, wherein at least a portion of the third electrode is positioned between the first and second electrodes, means for generating an electromagnetic field between the first and second electrodes, means for electrically controlling the third electrode, wherein the third electrode modifies the electromagnetic field, and a processor for detecting a presence of the analyte in the sample, based at least in part on a property of the electromagnetic field.


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