The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Jun. 15, 2018
Applicant:

Oxford University Innovation Limited, Oxford, GB;

Inventors:

Kamaljit Singh Chana, Oxford, GB;

Vikram Sridhar, Oxford, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/18 (2006.01);
U.S. Cl.
CPC ...
G01N 27/18 (2013.01);
Abstract

A probe comprises a resistive element configured to be brought into thermal contact with an entity to be sensed. A measurement system applies a plurality of heating pulses to the resistive element by driving an electrical current through the resistive in element and measures an electrical response of the resistive element to the heating pulses in order to determine information about either or both of the composition and state of the entity. The measurement system generates an output signal using the measured electrical response, wherein the output signal is generated by progressively offsetting the measured electrical response such that, in the event of an average temperature of the resistive element changing between different heating pulses due to a drift in the average temperature of a portion of the entity being sensed, a variance over the plurality of heating pulses of a value of the output signal at a predetermined common reference point within each heating pulse is reduced.


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