The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
May. 17, 2021
Gen-probe Incorporated, San Diego, CA (US);
Norbert D. Hagen, Carlsbad, CA (US);
David Opalsky, San Diego, CA (US);
George T. Walker, San Diego, CA (US);
Byron J. Knight, San Diego, CA (US);
GEN-PROBE INCORPORATED, San Diego, CA (US);
Abstract
Method for calibrating or monitoring performance of an optical measurement device that includes using a robotic arm to move a reference device having an optical reference material into a signal-detecting position of the optical measurement device. With the optical measurement device, detecting an emission emitted by the optical reference material of the reference device in the signal-detecting position. Then generating a reference signal representing a characteristic of the emission detected by the optical measurement device and comparing the reference signal to an expected reference signal for the emission to calibrate or monitor the performance of the optical measurement device.