The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Apr. 10, 2018
Endress+hauser Se+co. KG, Maulburg, DE;
Endress+Hauser SE+Co. KG, Maulburg, DE;
Abstract
Provided is a method for process monitoring in automation technology based at least on one capacitive and/or conductive measuring probe for determining at least one process variable of at least one medium in a container, an apparatus suitable for executing the method, as well as a computer program and a computer readable medium. The method includes method steps of ascertaining whether the measuring probe is at least partially in contact with the medium and registering as a function of time at least an electrical conductivity of the medium, a dielectric constant of the medium and/or a degree of coverage of the measuring probe by the medium. The method also includes a step of monitoring the process running within the container based on the electrical conductivity, the dielectric constant and/or the degree of coverage as a function of time.