The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Aug. 28, 2020
Xi'an Jiaotong University, Xi'an, CN;
XI'AN JIAOTONG UNIVERSITY, Xi'an, CN;
Abstract
A method for measuring geometric errors of a numerical control turntable based on a four-station laser tracer system includes: establishing a self-calibration coordinate system and calibrating positions of tracking interferometers; respectively placing each of target lenses at three non-coplanar points that are above the numerical control turntable and keep certain distances from the numerical control turntable, controlling the numerical control turntable to rotate at a certain angular interval θ, and based on positions of the tracking interferometers being known after calibration, solving coordinates of each of measurement points in the self-calibration coordinate system using a non-linear least square method; establishing a turntable coordinate system; perform a conversion between the turntable coordinate system and the self-calibration coordinate system; separating six geometric errors of the numerical control turntable using spatial position errors of the three points at a same position and using the linear least squares method.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile