The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Jun. 07, 2020
Applicant:
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Inventor:
Dominik Seitz, Schwaebisch Gmuend, DE;
Assignee:
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/016 (2006.01); G01B 7/008 (2006.01); G01B 11/00 (2006.01); G01B 7/016 (2006.01);
U.S. Cl.
CPC ...
G01B 7/008 (2013.01); G01B 5/016 (2013.01); G01B 7/016 (2013.01); G01B 11/005 (2013.01); G01B 11/007 (2013.01);
Abstract
An articulating probe for a measurement device includes a base platform, a rotor platform that is movable relative to the base platform, and a sensor element coupled to the rotor platform. The rotor platform is coupled to the base platform via a spherical parallel kinematic system.