The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Apr. 08, 2021
Applicant:

Invensense, Inc., San Jose, CA (US);

Inventors:

Ilya Gurin, Mountain View, CA (US);

Leonardo Baldasarre, Gavirate, IT;

Assignee:

INVENSENSE, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/31 (2006.01); G01B 7/00 (2006.01); G01B 7/305 (2006.01); H01L 21/66 (2006.01); G01D 5/241 (2006.01);
U.S. Cl.
CPC ...
G01B 7/003 (2013.01); G01B 7/305 (2013.01); G01B 7/31 (2013.01); H01L 22/34 (2013.01); G01D 5/2412 (2013.01); H01L 22/14 (2013.01);
Abstract

The present disclosure relates to measuring misalignment between layers of a semiconductor device. In one embodiment, a device includes a first conductive layer; a second conductive layer; one or more first electrodes embedded in the first conductive layer; one or more second electrodes embedded in the second conductive layer; a sensing circuit connected to the one or more first electrodes; and a plurality of time-varying signal sources connected to the one or more second electrodes, wherein the one or more first electrodes and the one or more second electrodes form at least a portion of a bridge structure that exhibits an electrical property that varies as a function of misalignment of the first conductive layer and the second conductive layer in an in-plane direction.


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