The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2023
Filed:
Jan. 04, 2018
Applicant:
University of Southern California, Los Angeles, CA (US);
Inventors:
Guanbo Chen, Los Angeles, CA (US);
Mahta Moghaddam, Los Angeles, CA (US);
John Stang, Los Angeles, CA (US);
Mark Haynes, Los Angeles, CA (US);
Assignee:
UNIVERSITY OF SOUTHERN CALIFORNIA, Los Angeles, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/01 (2006.01); A61B 5/0507 (2021.01); A61B 18/04 (2006.01); A61B 18/18 (2006.01); A61B 18/20 (2006.01); A61B 18/00 (2006.01); A61B 18/22 (2006.01);
U.S. Cl.
CPC ...
A61B 5/015 (2013.01); A61B 5/0507 (2013.01); A61B 18/04 (2013.01); A61B 18/1815 (2013.01); A61B 2018/00803 (2013.01); A61B 2018/183 (2013.01); A61B 2018/20353 (2017.05); A61B 2018/2261 (2013.01);
Abstract
A method for determining a change of temperature of an object. The method may include heating an object and measuring scattering parameters (S-parameters) of scattered microwave electric fields from the object. A distorted Born iterative method may be used to determine a change of a dielectric property of the object based on the measured S-parameters. A change of temperature of the object may be determined based on the change of the dielectric property of the object.