The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Jan. 31, 2019
Applicant:

Deere & Company, Moline, IL (US);

Inventors:

Gurmukh H. Advani, West Fargo, ND (US);

Noel W. Anderson, Fargo, ND (US);

Kartheek Karna, Fargo, ND (US);

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01D 41/127 (2006.01); A01D 75/28 (2006.01); A01F 12/44 (2006.01); A01D 75/00 (2006.01); H04R 3/00 (2006.01); H04R 5/027 (2006.01); H04R 5/04 (2006.01);
U.S. Cl.
CPC ...
A01D 41/1271 (2013.01); A01D 41/1276 (2013.01); A01D 75/00 (2013.01); A01F 12/448 (2013.01); H04R 3/005 (2013.01); H04R 5/027 (2013.01); H04R 5/04 (2013.01); A01D 75/282 (2013.01);
Abstract

Receivers are arranged to detect a corresponding observed phase shift, observed attenuation or other observed signal parameters for its respective microphone. An electronic data processor is adapted to estimate a distribution or quantity of material on the sieve based on the observed phase shift, the observed attenuation or the other observed signal parameters relative to a reference phase shift, a reference attenuation or other reference signal parameter. The operator can be alerted via a user interface if the material on the sieve is unevenly distributed or matches a preestablished distribution profile, or the sieve can be adjusted by an actuator to promote a generally uniform distribution.


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