The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Feb. 01, 2021
Applicant:

The Nielsen Company (Us), Llc, New York, NY (US);

Inventor:

Dominic H. Ngai, Allen, TX (US);

Assignee:

The Nielsen Company (US), LLC, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04W 4/33 (2018.01); H04W 4/30 (2018.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 4/30 (2018.02); H04W 4/33 (2018.02);
Abstract

Example methods and apparatus to measure wireless networks indoors are disclosed herein. An apparatus includes a memory, and at least one processor to identify information unique to a mobile device communicatively coupled to a server, select a benchmarking test based on the information unique to the mobile device, the benchmarking test including at least one of a first measurement test, a second measurement test or a third measurement test, the first measurement test including a default latency test, the second measurement test including measurement instructions stored on the mobile device, and the third measurement test including measurement instructions to be downloaded to the mobile device communicatively coupled to the server, and cause transmission of instructions to the mobile device, the instructions to perform the selected benchmarking test.


Find Patent Forward Citations

Ngai, Dominic. (2022). Methods and apparatus to measure wireless networks indoors (U.S. Patent No. 11540154). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11540154

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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