The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Oct. 09, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Fei Peng, Chengdu, CN;

Kaikai Jia, Chengdu, CN;

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

The present disclosure relates to a method, a device, and a computer program product for abnormality detection. The method provided by embodiments of the present disclosure includes: acquiring information related to a target request initiated by a client terminal to an application and at least one context request, the information at least indicating the type and initiation time of the target request and the type and initiation time of the at least one context request; converting the acquired information into a vectorized feature representation for the target request; and determining an abnormality detection result of the target request based on the vectorized feature representation and using an abnormality detection model, the abnormality detection result indicating whether the target request is an abnormal request, and the abnormality detection model characterizing a correlation between a vectorized feature representation for a request and an abnormality detection result.


Find Patent Forward Citations

Peng, Fei. (2022). Method, device, and computer program product for abnormality detection (U.S. Patent No. 11539730). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11539730

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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