The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Apr. 16, 2020
Applicant:

Silicon Laboratories Inc., Austin, TX (US);

Inventors:

Jeffrey L. Sonntag, Austin, TX (US);

Hatem M. Osman, Austin, TX (US);

Gang Yuan, Austin, TX (US);

Assignee:

Silicon Laboratories Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01); G11C 7/12 (2006.01); G11C 7/10 (2006.01); H03M 1/66 (2006.01); G11C 11/412 (2006.01); G11C 5/14 (2006.01); G11C 11/419 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G11C 5/147 (2013.01); G11C 7/1078 (2013.01); G11C 7/12 (2013.01); G11C 11/412 (2013.01); G11C 11/419 (2013.01); H03M 1/66 (2013.01);
Abstract

A physically unclonable function (PUF) includes a bit cell that includes a latch and a switch to selectively couple the latch to a supply voltage node. A first transmission gate couples a first bit line to a first internal node of the latch and a second transmission gate couples a second bit line to a second internal node of the latch. A digital to analog converter (DAC) circuit is selectively coupled to the first internal node through the first bit line and the first transmission gate and to the second internal node through the second bit line and the second transmission gate, to thereby precharge the latch before the first bit cell is read. The latch regenerates responsive to the switch being closed to connect the latch to the supply voltage node. The first and second bit lines are used to read the regenerated value of the latch.


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