The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Jan. 18, 2022
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Zhiping Jiang, Kanata, CA;

Junho Chang, Kanata, CA;

Choloong Hahn, Nepean, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04B 10/0791 (2013.01); H04B 10/0799 (2013.01); H04B 10/07953 (2013.01); H04B 10/07955 (2013.01);
Abstract

The disclosed systems and methods for optical filter fault localization. The optical filter fault localization is based on: i) determining an accumulated noise density at frequencies where ASE noise is filtered out by a faulty optical filter in an optical signal; ii) comparing the accumulated noise density with predicted accumulated noise densities, the predicted accumulated noise densities representing noises predicted from a plurality of optical filters to a receiver; and iii) determining, based on the comparison of the accumulated noise density and the predicted accumulated noise densities, a location of the faulty optical filter.


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