The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Oct. 16, 2020
Applicant:

Wayne State University, Detroit, MI (US);

Inventors:

Wen Li, Troy, MI (US);

Suk Kyoung Lee, Troy, MI (US);

Duke Debrah, Detroit, MI (US);

Gabriel Stewart, Warren, MI (US);

Assignee:

Wayne State University, Detroit, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/11 (2006.01); G01J 11/00 (2006.01); H01S 3/10 (2006.01); H01S 3/00 (2006.01); H01S 3/067 (2006.01);
U.S. Cl.
CPC ...
H01S 3/11 (2013.01); H01S 3/10061 (2013.01); H01S 3/005 (2013.01); H01S 3/06712 (2013.01);
Abstract

A system for determining an absolute carrier-envelope phase (CEP) of ultrashort laser pulses includes a laser system for generating a laser beam including ultrashort optical pulses of a duration of less than 10 fs, an ultrabroadband quarter-wave plate configured to polarize the laser beam, and a gas jet emitting a continuous jet stream into the laser beam. The system includes focusing optics to adjust a focal spot of the laser beam to the gas jet, and a detector arrangement including a beam block and a microchannel plate (MCP) imaging detector, wherein the laser beam is directed to the detector arrangement. The method involves using angular streaking to determine the absolute CEP of both elliptically and linearly polarized light.


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