The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Feb. 12, 2021
Cnh Industrial Canada, Ltd., Saskatoon, CA;
James W. Henry, Saskatoon, CA;
Christopher Nicholas Warwick, Hertfordshire, GB;
David John Powell, Cambridge, GB;
CNH Industrial Canada, Ltd., Saskatoon, CA;
Abstract
A method for determining residue length within a field includes receiving, with a computing system, a captured image depicting an imaged portion of the field from one or more imaging devices. Furthermore, the method includes determining, with the computing system, an image gradient orientation at each of a plurality of pixels within the captured image. Additionally, the method includes identifying, with the computing system, a residue piece present within the image portion of the field based at least in part on the determined image gradient orientations. Moreover, the method includes determining, with the computing system, a length of the identified residue piece.