The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2022
Filed:
Feb. 14, 2019
Volume Graphics Gmbh, Heidelberg, DE;
Thomas Günther, Heidelberg, DE;
Christof Reinhart, Heidelberg, DE;
Christoph Poliwoda, Heidelberg, DE;
Volume Graphics GmbH, Heidelberg, DE;
Abstract
The invention relates to a method for determining errors in at least one parameter of the object derived from a digital representation of an object, wherein the digital representation comprises a large number of pixels arranged on a grid. At least one item of image information that quantifies a material-specific value of the object at the position of the pixel is assigned to a pixel. The image information results from a metrological mapping of the object, and is overlaid with statistical noise. As a result of the metrological mapping of the object, the image information of a first pixel is correlated to the image information of pixels within a surroundings of the first pixel defined by a correlation length of the image.