The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Jan. 09, 2020
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Amarnath Nayak, Mumbai, IN;

Leon Stenneth, Chicago, IL (US);

Alex Averbuch, Buffalo Grove, IL (US);

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 20/20 (2019.01);
Abstract

A system, a method and a computer program product are provided for evaluating quality of data, such as sensor data and map data, using a machine learning model. The system may include at least one memory configured to store computer executable instructions and at least one processor configured to execute the computer executable instructions to obtain first sensor features of the first sensor data associated with a road object in a first geographic region, first map features of the first map data associated with the road object and ground truth data associated with the road object. The processor may be configured to generate the machine learning model by configuring the ground truth data and calculating first information scores for each of the first sensor features and the first map features by recursively splitting each of the first sensor features and the first map features.


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